21/04/2025
🔬 Nearly invisible defects, very real challenges
📊 As the pushes below the 5nm node, defect detection becomes a true technological feat. We’re not just talking about atomic scales, but about phenomena that challenge the limits of traditional inspection techniques.
📖 Semiconductor Engineering Articles, explores how manufacturers are combining multiple tools—optical, e-beam, wavefront phase imaging ( ), analysis, and modeling—to identify defects that were previously impossible to see.
🙌 At Wooptix, we are truly grateful to have contributed to this piece, written by Gregory Haley, Editor at Semiconductor Engineering. We believe the future of lies in going beyond what’s visible, in capturing information from the phase of light, not just its intensity. 👉 https://semiengineering.com/nearly-invisible-the-future-of-defect-detection-below-5nm/
🧭 Our commitment to the sensing technique allows us to extract data that opens up new possibilities for detecting and understanding defects in increasingly advanced processes.
💡 The challenge is not just to see more, but to understand better.
📉 Fewer defects, better yield.
🔁 More iteration, more innovation.
Here’s the full article: 👉 https://semiengineering.com/nearly-invisible-the-future-of-defect-detection-below-5nm/
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