Wentworth Laboratories

27/10/2020

We're pleased to announce a new representative agreement with JC Electronics Corporation in Japan!

www.wentworthlabs.com/new-agreement-with-jc-electronics-in-japan/

Wentworth Laboratories has signed a new agreement with JC Electronics Corporation in Japan for the sale of probe cards and probers.

17/03/2020

Do you have different probing environments which require your chuck plate to be configured in many different ways? Making a system that is easy and quick to configure helps engineers obtain fast and accurate results. Our high voltage chuck, insulated up to 10 kV, can also be used for extreme high current and provide capability for all MOS device characterization including quasi-static/CV measurements. Cabling configuration can be changed in seconds thanks to the current/voltage selector switch and without the need for extensive wiring changes.

www.wentworthlabs.com/wafer-chucks

09/03/2020

Driven by government initiatives towards energy saving and the rise in personal disposable income, it’s no surprise that growth in the flexible electronics industry is forecasted to reach $17.2B by 2024*. This market covers a wide range of applications from wearable technology to bio-sensors, flexible displays and thin-film batteries. As processes become more refined, the development curve increases exponentially leading to significant technology breakthroughs.

Wentworth has been supporting this emerging market for over 15 years with a range of probing solutions for both research and production. We have been working with market leaders to provide the verification and test platforms to drive development forward. Whether your issue is contact force due to fragile organic pad materials, or substrates that are sensitive to mishandling, we have proven solutions.

Unfortunately, LOPEC (the trade fair for printed electronics due to take place later this month) has been cancelled for this year. However, contact either Wentworth or one of our partners to find out how we can help with your application.

*source Research Nester. Photography courtesy of Plastic Logic.

05/03/2020

We have appointed Gaston Sales as our representative, to support new and existing customers in Oregon, Washington, Idaho and Utah. Big welcome to Mark Fagin and his team!

www.wentworthlabs.com/wentworth-laboratories-expands-into-the-pacific-northwest/

03/03/2020

Probing at extreme temperatures? Our high temperature probe cards are ideal for use in test environments up to +300°C. They are suitable for hot chuck applications and can also be mounted on manipulators. Our cryogenic and low temperature probe cards cater for temperatures as low as -271°C. The use of a special cryogenic epoxy, which is typically used in space applications, prevents materials from becoming brittle at extremely low temperatures.

www.wentworthlabs.com/extreme-temperature-probe-cards/

25/02/2020

Our interchangeable chuck system allows for quick and easy chuck plate change, offering maximum return on your probe station investment. One option is the wafer frame chuck - learn more about probing die on wafer frames:

www.wentworthlabs.com/wafer-frame-probing

19/02/2020

360° chuck rotation is an unusual requirement. Whilst not mechanically challenging, it does provide some interesting issues around control, particularly regarding angular positioning and cable management. We have developed a 360° chuck for a customer needing to simultaneously probe and sense optical devices in a particular orientation, without the probe needles obscuring any part of the device. The chuck solution allowed for the two opposite sides of each device to be probed, 180° at the time. This ensured that the detector above the device, which formed an essential part of the test process, was not obscured during any part of the testing.

Find out what other custom chuck applications we have developed!

www.wentworthlabs.com/the-diversity-of-wafer-chucks/

13/02/2020

When it comes to probe card design, device layout and device files are available in many different formats. Our proprietary design to manufacture CAD/CAM software can accept and convert any format for seamless use with the software package. The software will also complement our experience in building probe cards by calculating the optimum probe material, probe tip shape, probe force & scrub as well as diameters and lengths.

https://bit.ly/2tQx1Ym

10/02/2020

Delighted to have Gomeasure on board, as our new representative for Denmark and Iceland!

Wentworth appoints GOmeasure as their new representative for Denmark and Iceland.

31/01/2020

Do you need to test die, which are no longer in wafer form? Singulated die chucks are typically required for known-good-die (KGD), or where die separation is required to perform functional testing. Designs can be mechanical hold-down or vacuum; where vacuum is selected, this can be achieved via chamber or micro-holes. Chucks with high level of flatness can be designed to hold any number of dies, including different sized die on the same chuck. Subject to pad size, pattern recognition capability can then be used to locate each die for probing. This also allows the flexibility to not fully populate the die carrier, with the system still functioning correctly. If no die is present, this will not be added to the wafer map.

Let us know if you have any custom chuck requirements!

https://www.wentworthlabs.com/wafer-chucks/

31/01/2020

With the World Health Organization’s (WHO) declaration of the Coronavirus as a global health emergency, the SEMICON Korea exhibition, scheduled for next week, has been cancelled. The organisers are currently exploring contingency plans.

For more information and latest status on this event, visit the SEMICON Korea website: www.semiconkorea.org/en/

Dear exhibitors and visitors, With the World Health Organization’s (WHO) declaration of the Novel Coronavirus (2019 nCoV) as a global health emergency, SEMI will no longer host SEMICON Korea 2020 at COEX in Seoul, South Korea, February 5-7 as originally scheduled. SEMI regrets any inconvenience to...