28/05/2025
โ ๐๐๐ฝ๐ถ๐๐ฒ๐ฟ ๐๐ถ๐๐ฐ๐ผ๐๐ฒ๐ฟ๐ ๐๐๐ โ Launch Day โ ๐
Weโre excited to introduce the new Jupiter Discovery Atomic Force Microscope.
This next-generation large-sample AFM delivers best-in-class performance combined with exceptional ease of use.
๐นSimplified Workflow for Maximum Productivity
Pre-mounted probes, a unique side-view camera, and exclusive FFM-Topography imaging mode with AutoPilot simplify the entire imaging workflow.
๐นNext-Generation Design for Ultimate Performance
Jupiter Discovery achieves ultra-high resolution and scan rates 5-20x faster than other large-sample AFMs to set a new benchmark in its segment.
๐นUnmatched Configurability for Meeting Diverse Challenges
A vast selection of accessories and capabilities enables multidisciplinary research, while configuration options help span a wider range of research budgets.
๐๐ถ๐๐ฐ๐ผ๐๐ฒ๐ฟ ๐ก๐ฒ๐
๐-๐๐ฒ๐ป๐ฒ๐ฟ๐ฎ๐๐ถ๐ผ๐ป ๐๐๐ ๐ฃ๐ฒ๐ฟ๐ณ๐ผ๐ฟ๐บ๐ฎ๐ป๐ฐ๐ฒ, ๐ณ๐ผ๐ฟ ๐๐๐ฒ๐ฟ๐๐ผ๐ป๐ฒ:
https://okt.to/XYAIWo
Image 1: Jupiter Discovery; Image 2: Pre-mounted probe; Image 3: Side-view camera image; Image 4: Silicon photonics waveguide structures imaged using FFM-Topography with AutoPilot mode, 18 ยตm scan size; Image 5: Silicon carbide substrate with 0.75 nm steps. Imaged using FFM-Topography with AutoPilot mode, 5 ยตm scan size
