10/09/2026
Counterfeit microelectronics aren’t just a reliability problem. They’re a security risk.
A counterfeit component can be substandard and compromise the stability of a system. In more serious cases, malicious components could potentially be used to introduce vulnerabilities into the systems where they’re deployed.
So how can we detect them?
At the SMTA Symposium on Counterfeit Parts and Materials, NHanced Semiconductors’ Charles Woychik presented an approach for using AI-enhanced physical inspection to help identify counterfeit microelectronics.
By combining advanced inspection techniques with AI, we can move toward more effective ways to verify components and strengthen the security of critical systems.
Read the presentation and explore the approach:
https://nhanced-semi.com/2026/06/11/ai-enhanced-physical-inspection-for-counterfeit-microelectronics/